Scaling feature size improves processor performance but increases each device’s susceptibility to defects (i.e., hard errors). As a result, fabrication technology must improve s...
Concerns about the reliability of real-time embedded systems that employ dynamic voltage scaling has recently been highlighted [1,2,3], focusing on transient-fault-tolerance techn...
Alireza Ejlali, Marcus T. Schmitz, Bashir M. Al-Ha...
Control-flow misprediction penalties are a major impediment to high performance in wide-issue superscalar processors. In this paper we present Selective Eager Execution (SEE), an ...
— Small gates, such as AND2, XOR2 and MUX2, have been mixed with lookup tables (LUTs) inside the programmable logic block (PLB) to reduce area and power and increase performance ...
—In this paper, we propose a novel on-chip communication scheme by dividing the resources of a traditional packet-switched network-on-chip between a packet-switched and a circuit...
Mehdi Modarressi, Hamid Sarbazi-Azad, Mohammad Arj...