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TCAD
2008
73views more  TCAD 2008»
15 years 3 months ago
Reduction of Parametric Failures in Sub-100-nm SRAM Array Using Body Bias
Abstract--In this paper, we present a postsilicon-tuning technique to improve parametric yield of SRAM array using body bias (BB). First, we show that, although parametric failures...
Saibal Mukhopadhyay, Hamid Mahmoodi, Kaushik Roy
ICST
2010
IEEE
15 years 2 months ago
Generating Transition Probabilities for Automatic Model-Based Test Generation
—Markov chains with Labelled Transitions can be used to generate test cases in a model-based approach. These test cases are generated by random walks on the model according to pr...
Abderrahmane Feliachi, Hélène Le Gue...
ACL
2009
15 years 1 months ago
Active Learning for Multilingual Statistical Machine Translation
Statistical machine translation (SMT) models require bilingual corpora for training, and these corpora are often multilingual with parallel text in multiple languages simultaneous...
Gholamreza Haffari, Anoop Sarkar
ICDAR
2009
IEEE
15 years 1 months ago
Recognition of Handwritten Numerical Fields in a Large Single-Writer Historical Collection
This paper presents a segmentation-based handwriting recognizer and the performance that it achieves on the numerical fields extracted from a large single-writer historical collec...
Marius Bulacu, Axel Brink, Tijn van der Zant, Lamb...
144
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CVPR
2011
IEEE
14 years 12 months ago
Truncated Message Passing
Training of conditional random fields often takes the form of a double-loop procedure with message-passing inference in the inner loop. This can be very expensive, as the need to...
Justin Domke