11784 search results - page 8 / 2357 » Improving Software Process Improvement |
EUROSPI
2005
Springer
15 years 3 months ago
2005
Springer
HICSS
2000
IEEE
15 years 2 months ago
2000
IEEE
CAISE
2008
Springer
15 years 2 days ago
2008
Springer
ASPDAC
2007
ACM
14 years 12 months ago
2007
ACM
- Exceptionally leaky transistors are increasingly more frequent in nano-scale technologies due to lower threshold voltage and its increased variation. Such leaky transistors may e...
COMPUTER
2007
14 years 10 months ago
2007
