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DATE
2010
IEEE
15 years 3 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
ICDAR
2003
IEEE
15 years 3 months ago
2003
IEEE
This paper studies on the mirror image learning algorithm for the autoassociative neural networks and evaluates the performance by handwritten numeral recognition test. Each of th...
CIKM
2008
Springer
14 years 12 months ago
2008
Springer
This paper points out that many machine learning problems in IR should be and can be formalized in a novel way, referred to as `group-based learning'. In group-based learning...
FLAIRS
2006
14 years 11 months ago
2006
In this paper we test whether a correlation exists between the optimal mutation rate and problem difficulty. We find that the range of optimal mutation rates is inversely proporti...
ITC
1998
IEEE
15 years 2 months ago
1998
IEEE
We investigate defects in CMOS domino gates and derive the test conditions for them. Very-Low-Voltage Testing can improve the defect coverage, which we define as the maximum detec...