882 search results - page 100 / 177 » Improving Visual Impact Analysis |
BMCBI
2006
14 years 10 months ago
2006
Background: In this study, we present a robust and reliable computational method for tag-togene assignment in serial analysis of gene expression (SAGE). The method relies on curre...
ISPASS
2007
IEEE
15 years 4 months ago
2007
IEEE
Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...
ITC
1998
IEEE
15 years 2 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
TASE
2008
IEEE
14 years 9 months ago
2008
IEEE
Abstract--Cluster tools are widely used as semiconductor manufacturing equipment. While throughput analysis and scheduling of single-cluster tools have been well-studied, research ...
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HPCA
2008
IEEE
15 years 10 months ago
2008
IEEE
Portable, embedded systems place ever-increasing demands on high-performance, low-power microprocessor design. Dynamic voltage and frequency scaling (DVFS) is a well-known techniq...