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ECCV
2008
Springer
16 years 2 months ago
A Linear Time Histogram Metric for Improved SIFT Matching
We present a new metric between histograms such as SIFT descriptors and a linear time algorithm for its computation. It is common practice to use the L2 metric for comparing SIFT d...
Ofir Pele, Michael Werman
IPMI
2003
Springer
16 years 1 months ago
Improving Appearance Model Matching Using Local Image Structure
I. M. Scott, Timothy F. Cootes, Christopher J. Tay...
SIGMOD
2008
ACM
124views Database» more  SIGMOD 2008»
16 years 1 months ago
Improving suffix array locality for fast pattern matching on disk
Ranjan Sinha, Simon J. Puglisi, Alistair Moffat, A...
66
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ICPR
2008
IEEE
15 years 7 months ago
Improving efficiency of fingerprint matching by minutiae indexing
Yangyang Zhang, Jie Tian, Kai Cao, Peng Li, Xin Ya...