The Internet and the Grid are changing the face of high performance computing. Rather than tightly-coupled SPMD-style components running in a single cluster, on a parallel machine...
— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builti...
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola N...
Storage systems are increasingly subject to attacks. Cryptographic file systems mitigate the danger of exposing data by using encryption and integrity protection methods and guar...
In this paper, we describe versatile and powerful algorithms for searching guess-and-determine and meet-in-the-middle attacks on byte-oriented symmetric primitives. To demonstrate ...
Charles Bouillaguet, Patrick Derbez, Pierre-Alain ...