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DATE
2005
IEEE
127views Hardware» more  DATE 2005»
15 years 10 months ago
A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Rayc...
ISBI
2006
IEEE
16 years 5 months ago
Improved comparison of protein subcellular location patterns
* A common task in cell and molecular biology is to evaluate the difference or similarity among location patterns under different circumstances. Our previous work has described an...
Ting Zhao, Stalia Soto, Robert F. Murphy
ECAI
2004
Springer
15 years 10 months ago
Exploiting Association and Correlation Rules - Parameters for Improving the K2 Algorithm
A Bayesian network is an appropriate tool to deal with the uncertainty that is typical of real-life applications. Bayesian network arcs represent statistical dependence between dif...
Evelina Lamma, Fabrizio Riguzzi, Sergio Storari
158
Voted
AINA
2007
IEEE
15 years 8 months ago
Improving distributed join efficiency with extended bloom filter operations
Bloom filter based algorithms have proven successful as very efficient technique to reduce communication costs of database joins in a distributed setting. However, the full potent...
Loizos Michael, Wolfgang Nejdl, Odysseas Papapetro...
ICCAD
2001
IEEE
124views Hardware» more  ICCAD 2001»
16 years 1 months ago
Partition-Based Decision Heuristics for Image Computation Using SAT and BDDs
Methods based on Boolean satisfiability (SAT) typically use a Conjunctive Normal Form (CNF) representation of the Boolean formula, and exploit the structure of the given problem ...
Aarti Gupta, Zijiang Yang, Pranav Ashar, Lintao Zh...