Sciweavers

5273 search results - page 27 / 1055
» Improving quality together
Sort
View
133
Voted
DAC
1999
ACM
16 years 6 months ago
Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme
Huan-Chih Tsai, Kwang-Ting Cheng, Sudipta Bhawmik
ISVLSI
2007
IEEE
131views VLSI» more  ISVLSI 2007»
15 years 12 months ago
Improving the Quality of Bounded Model Checking by Means of Coverage Estimation
Formal verification has become an important step in circuit and system design. A prominent technique is Bounded Model Checking (BMC) which is widely used in industry. In BMC it i...
Ulrich Kühne, Daniel Große, Rolf Drechs...
WISE
2007
Springer
15 years 12 months ago
Incremental Quality Improvement in Web Applications Using Web Model Refactoring
Luis Olsina, Gustavo Rossi, Alejandra Garrido, Dam...