22 search results - page 1 / 5 » Improving the Performance of GALS-Based NoCs in the Presence... |
NOCS
2010
IEEE
13 years 4 months ago
2010
IEEE
DAC
2004
ACM
13 years 10 months ago
2004
ACM
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
- Exceptionally leaky transistors are increasingly more frequent in nano-scale technologies due to lower threshold voltage and its increased variation. Such leaky transistors may e...
TCAD
2008
13 years 6 months ago
2008
Abstract--Advances in very large-scale integration technology make clock skew more susceptible to process variations. Notwithstanding efficient exact zero-skew algorithms, clock sk...
MICRO
2008
IEEE
14 years 20 days ago
2008
IEEE
—Negative bias temperature instability (NBTI), which reduces the lifetime of PMOS transistors, is becoming a growing reliability concern for sub-micrometer CMOS technologies. Par...