In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
The major obstacle to use multicores for real-time applications is that we may not predict and provide any guarantee on real-time properties of embedded software on such platforms...
In this paper, we consider a hybrid solution to the sensor network position inference problem, which combines a real-time filtering system with information from a more expensive,...
Dimitri Marinakis, David Meger, Ioannis M. Rekleit...
Boosted one-versus-all (OVA) classifiers are commonly used in multiclass problems, such as generic object recognition, biometrics-based identification, or gesture recognition. Join...
Alexandra Stefan (University of Texas at Arlington...
We study the problem of minimizing the expected cost of binary searching for data where the access cost is not fixed and depends on the last accessed element, such as data stored i...
Gonzalo Navarro, Ricardo A. Baeza-Yates, Eduardo F...