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108
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DAC
2011
ACM
13 years 11 months ago
2011
ACM
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
115
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DGO
2011
13 years 11 months ago
2011
The rising awareness of the challenges of preserving information over the long term has led to a wealth of initiatives developing economic models, methods, tools, systems, guideli...
198
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DOCENG
2011
ACM
13 years 11 months ago
2011
ACM
The growth of mobile phone users has lead to a dramatic increasing of SMS spam messages. In practice, fighting mobile phone spam is difficult by several factors, including the lo...
120
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DSN
2011
IEEE
13 years 11 months ago
2011
IEEE
—Aggressive technology scaling causes chip multiprocessors increasingly error-prone. Core-level faulttolerant approaches bind two cores to implement redundant execution and error...
233
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EMMCVPR
2011
Springer
13 years 11 months ago
2011
Springer
Length and area regularization are commonplace for inverse problems today. It has however turned out to be much more difficult to incorporate a curvature prior. In this paper we pr...