59 search results - page 5 / 12 » Increasing Functional Coverage by Inductive Testing: A Case ... |
148
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IJCAI
1993
15 years 6 months ago
1993
In this paper we present an average-case analysis of the nearest neighbor algorithm, a simple induction method that has been studied by manyresearchers. Our analysis assumes a con...
156
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VLSID
2000
IEEE
15 years 8 months ago
2000
IEEE
We address the problem of verifying the correctness of pre-silicon models of a microprocessor. We touch on the latest advances in this area by considering two different aspects of...
139
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KBSE
2007
IEEE
15 years 11 months ago
2007
IEEE
Automating the generation of object-oriented unit tests is a challenging task. This is mainly due to the complexity and peculiarities that the principles of object-orientation imp...
149
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ICST
2009
IEEE
15 years 11 months ago
2009
IEEE
—Model-based test derivation for real-time system has been proven to be a hard problem for exhaustive test suites. Therefore, techniques for real-time testing do not aim to exhau...
139
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VTS
1996
IEEE
15 years 9 months ago
1996
IEEE
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...