59 search results - page 9 / 12 » Increasing Functional Coverage by Inductive Testing: A Case ... |
80
Voted
DAC
2007
ACM
16 years 18 days ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
109
Voted
CASES
2006
ACM
15 years 3 months ago
2006
ACM
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...
BMCBI
2006
14 years 11 months ago
2006
Background: Microarray technology produces gene expression data on a genomic scale for an endless variety of organisms and conditions. However, this vast amount of information nee...
101
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GECCO
2007
Springer
15 years 5 months ago
2007
Springer
The Second Harmonic Generation (SHG), a process that turns out to be a good test case in the physics lab, can also be considered as a fairly simple theoretical test function for g...
111
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CODES
2007
IEEE
15 years 3 months ago
2007
IEEE
System-level and Platform-based design, along with Transaction Level modeling (TLM) techniques and languages like SystemC, appeared as a response to the ever increasing complexity...