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93
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DAC
2003
ACM
15 years 11 months ago
2003
ACM
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
DAC
2004
ACM
15 years 11 months ago
2004
ACM
The increasing complexity of today's mixed-signal integrated circuits necessitates both top-down and bottom-up system-level verification. Time-domain state-space modeling and...
107
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DAC
2005
ACM
15 years 11 months ago
2005
ACM
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
DAC
2006
ACM
15 years 11 months ago
2006
ACM
As the technology node advances into the nanometer era, via-open defects are one of the dominant failures. To improve via yield and reliability, redundant-via insertion is a highl...
MICCAI
2004
Springer
15 years 11 months ago
2004
Springer
Abstract. This paper presents a novel method for photorealistic rendering of the bronchial lumen by directly deriving matched shading and texture parameters from video bronchoscope...