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ASPDAC
2010
ACM
150views Hardware» more  ASPDAC 2010»
14 years 10 months ago
Post-silicon debugging for multi-core designs
Escaped errors in released silicon are growing in number due to the increasing complexity of modern processor designs and shrinking production schedules. Worsening the problem are ...
Valeria Bertacco
ATS
2010
IEEE
261views Hardware» more  ATS 2010»
14 years 10 months ago
The Test Ability of an Adaptive Pulse Wave for ADC Testing
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-toDigital Converter (ADC), which is expensive to generate. Nowadays, an...
Xiaoqin Sheng, Hans G. Kerkhoff
ECMDAFA
2010
Springer
138views Hardware» more  ECMDAFA 2010»
14 years 9 months ago
A UML 2.0 Profile to Model Block Cipher Algorithms
Abstract. Current mobile digital communication systems must implement rigorous operations to guarantee high levels of confidentiality and integrity during transmission of critical ...
Tomás Balderas-Contreras, Gustavo Rodr&iacu...
FPL
2010
Springer
111views Hardware» more  FPL 2010»
14 years 9 months ago
Managing Short-Lived and Long-Lived Values in Coarse-Grained Reconfigurable Arrays
Abstract--Efficient storage in spatial processors is increasingly important as such devices get larger and support more concurrent operations. Unlike sequential processors that rel...
Brian Van Essen, Robin Panda, Aaron Wood, Carl Ebe...
ICIP
2010
IEEE
14 years 9 months ago
Learning image similarities via Probabilistic Feature Matching
In this paper, we propose a novel image similarity learning approach based on Probabilistic Feature Matching (PFM). We consider the matching process as the bipartite graph matchin...
Ziming Zhang, Ze-Nian Li, Mark S. Drew