Escaped errors in released silicon are growing in number due to the increasing complexity of modern processor designs and shrinking production schedules. Worsening the problem are ...
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-toDigital Converter (ADC), which is expensive to generate. Nowadays, an...
Abstract. Current mobile digital communication systems must implement rigorous operations to guarantee high levels of confidentiality and integrity during transmission of critical ...
Abstract--Efficient storage in spatial processors is increasingly important as such devices get larger and support more concurrent operations. Unlike sequential processors that rel...
Brian Van Essen, Robin Panda, Aaron Wood, Carl Ebe...
In this paper, we propose a novel image similarity learning approach based on Probabilistic Feature Matching (PFM). We consider the matching process as the bipartite graph matchin...