1925 search results - page 23 / 385 » Incremental test collections |
DFT
2003
IEEE
15 years 3 months ago
2003
IEEE
A new hybrid BIST scheme is proposed which is based on using an “incrementally guided LFSR.” It very efficiently combines external deterministic data from the tester with on-c...
DDECS
2008
IEEE
15 years 4 months ago
2008
IEEE
— Due to ever increasing design sizes more efficient tools for Automatic Test Pattern Generation (ATPG) are needed. Recently ATPG based on Boolean satisfiability (SAT) has been ...
VLDB
1992
ACM
15 years 1 months ago
1992
ACM
For very large databases such as those used by banks and airlines, cost considerations may forbid shutting down the service for a long period of time and reorganizing off-line. Si...
IJCAI
1989
14 years 11 months ago
1989
Incremental conceptual clustering is an important area of machine learning. It is concerned with summarizing data in a form of concept hierarchies, which will eventually ease the ...
ICST
2008
IEEE
15 years 4 months ago
2008
IEEE
This paper presents a method of component testing based on algebraic specifications. An algorithm for generating checkable test cases is proposed. A prototype testing tool called ...