1925 search results - page 56 / 385 » Incremental test collections |
ITC
2000
IEEE
15 years 4 months ago
2000
IEEE
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
SWAT
2004
Springer
15 years 5 months ago
2004
Springer
In this paper, we investigate the test set problem and its variations that appear in a variety of applications. In general, we are given a universe of objects to be “distinguish...
VLSID
2005
IEEE
15 years 5 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
108
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DATE
1999
IEEE
15 years 4 months ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
142
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SIGMOD
2012
ACM
13 years 2 months ago
2012
ACM
We present BloomUnit, a testing framework for distributed programs written in the Bloom language. BloomUnit allows developers to write declarative test specifications that descri...