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126
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DATE
2002
IEEE
15 years 7 months ago
2002
IEEE
Test sets for path delay faults in circuits with large numbers of paths are typically generated for path delay faults associated with the longest circuit paths. We show that such ...
161
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TASE
2010
IEEE
14 years 8 months ago
2010
IEEE
This paper focuses on the assignment of discrete points among K robots and determining the order in which the points should be processed by the robots, in the presence of geometric...
114
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ICCV
2003
IEEE
16 years 3 months ago
2003
IEEE
This paper discusses building complex classifiers from a single labeled example and vast number of unlabeled observation sets, each derived from observation of a single process or...
108
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JCT
2010
15 years 12 days ago
2010
A k-signed r-set on [n] = {1, ..., n} is an ordered pair (A, f), where A is an rsubset of [n] and f is a function from A to [k]. Families A1, ..., Ap are said to be cross-intersec...
125
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OTM
2004
Springer
15 years 7 months ago
2004
Springer
Abstract. To date, ontology research seems to have come to an equilibrium: there is a wide variety of theories, methods and tools for extracting, representing, storing and browsing...