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IPCV
2007
15 years 5 months ago
Use of Paraplanar Constraint for Parallel Inspection of Wafer Bump Heights
- The shrunk dimension of electronic devices leads to more stringent requirement on process control and quality assurance of their fabrication. For instance, direct die-to-die bond...
Mei Dong, Ronald Chung, Edmund Y. Lam, Kenneth S. ...
LWA
2007
15 years 5 months ago
Retrieval of technical drawings in DXF format - concepts and problems
Nowadays, launching new products in short intervals is a critical factor for success to persist on the global market. At the same time many enterprises call for cost reduction in ...
Nadine Weber, Andreas Henrich
MEDINFO
2007
266views Healthcare» more  MEDINFO 2007»
15 years 5 months ago
Automatic Image Modality Based Classification and Annotation to Improve Medical Image Retrieval
Medical image retrieval can play an important role for diagnostic and teaching purposes in medicine. Image modality is an important visual characteristic that can be used to impro...
Jayashree Kalpathy-Cramer, William R. Hersh
MVA
2007
210views Computer Vision» more  MVA 2007»
15 years 5 months ago
Represent Image Contents Using Curves and Chain Code
This paper presents a new approach to extracting and representing structural features of images. The approach is based on both a region-based analysis and a contour-based analysis...
Pornchai Mongkolnam, Chakarida Nukoolkit, Thanee D...
TRECVID
2008
15 years 5 months ago
Informedia @ TRECVID2008: Exploring New Frontiers
The Informedia team participated in the tasks of Rushes summarization, high-level feature extraction and event detection in surveillance video. For the rushes summarization, our b...
Alexander G. Hauptmann, Robert V. Baron, Ming-yu C...