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IUI
2010
ACM
15 years 11 months ago
Lowering the barriers to website testing with CoTester
In this paper, we present CoTester, a system designed to decrease the difficulty of testing web applications. CoTester allows testers to create test scripts that are represented ...
Jalal Mahmud, Tessa Lau
DATE
2008
IEEE
66views Hardware» more  DATE 2008»
15 years 10 months ago
Optimal Margin Computation for At-Speed Test
— In the face of increased process variations, at-speed manufacturing test is necessary to detect subtle delay defects. This procedure necessarily tests chips at a slightly highe...
Jinjun Xiong, Vladimir Zolotov, Chandu Visweswaria...
SIGSOFT
2004
ACM
15 years 9 months ago
Using an SQL coverage measurement for testing database applications
Many software applications have a component based on database management systems in which information is generally handled through SQL queries embedded in the application code. Wh...
María José Suárez Cabal, Javi...
126
Voted
DELTA
2004
IEEE
15 years 8 months ago
Scan Test of IP Cores in an ATE Environment
Manufacturing test of chips made of multiple IP cores requires different techniques if ATE is used. As scan chains are commonly used as access paths to the DUT, ATE architectures ...
Luca Schiano, Yong-Bin Kim, Fabrizio Lombardi
124
Voted
SIGIR
2004
ACM
15 years 9 months ago
Forming test collections with no system pooling
Forming test collection relevance judgments from the pooled output of multiple retrieval systems has become the standard process for creating resources such as the TREC, CLEF, and...
Mark Sanderson, Hideo Joho