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VLSID
2007
IEEE
160views VLSI» more  VLSID 2007»
16 years 4 months ago
Spectral RTL Test Generation for Microprocessors
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
Nitin Yogi, Vishwani D. Agrawal
ITC
2003
IEEE
123views Hardware» more  ITC 2003»
15 years 9 months ago
A Comprehensive Approach to Assessing and Analyzing 1149.1 Test Logic
In this paper we introduce a tool which is capable of verifying an 1149.1 test logic implementation and its compliance to the IEEE 1149.1 Standard [1][2] while providing a precise...
Kevin Melocco, Hina Arora, Paul Setlak, Gary Kunse...
EUROGP
2003
Springer
101views Optimization» more  EUROGP 2003»
15 years 9 months ago
An Enhanced Framework for Microprocessor Test-Program Generation
Test programs are fragment of code, but, unlike ordinary application programs, they are not intended to solve a problem, nor to calculate a function. Instead, they are supposed to ...
Fulvio Corno, Giovanni Squillero
ICPR
2002
IEEE
15 years 9 months ago
A Histogram-Based Color Consistency Test for Voxel Coloring
Voxel Coloring has become a popular technique for reconstructing a 3D scene from a set of 2D images. While many different variants of this technique exist, all rely on a test to d...
Mark R. Stevens, W. Bruce Culbertson, Thomas Malzb...
FATES
2004
Springer
15 years 8 months ago
Test Generation Based on Symbolic Specifications
Abstract. Classical state-oriented testing approaches are based on simple machine models such as Labelled Transition Systems (LTSs), in which data is represented by concrete values...
Lars Frantzen, Jan Tretmans, Tim A. C. Willemse