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ICCAD
1997
IEEE
144views Hardware» more  ICCAD 1997»
15 years 8 months ago
Partial scan delay fault testing of asynchronous circuits
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
Michael Kishinevsky, Alex Kondratyev, Luciano Lava...
XPU
2007
Springer
15 years 10 months ago
Inspecting Automated Test Code: A Preliminary Study
Testing is an essential part of an agile process as test is automated and tends to take the role of specifications in place of documents. However, whenever test cases are faulty, d...
Filippo Lanubile, Teresa Mallardo
QSIC
2005
IEEE
15 years 10 months ago
Towards a Metamorphic Testing Methodology for Service-Oriented Software Applications
Testing applications in service-oriented architecture (SOA) environments needs to deal with issues like the unknown communication partners until the service discovery, the impreci...
W. K. Chan, S. C. Cheung, Karl R. P. H. Leung
ISQED
2002
IEEE
203views Hardware» more  ISQED 2002»
15 years 9 months ago
Automatic Test Program Generation from RT-Level Microprocessor Descriptions
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
UML
2001
Springer
15 years 8 months ago
A UML-Based Approach to System Testing
System testing is concerned with testing an entire system based on its specifications. In the context of object-oriented, UML development, this means that system test requirements ...
Lionel C. Briand, Yvan Labiche