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DATE
1999
IEEE
147views Hardware» more  DATE 1999»
15 years 8 months ago
Efficient BIST Hardware Insertion with Low Test Application Time for Synthesized Data Paths
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
Nicola Nicolici, Bashir M. Al-Hashimi
ICSE
1999
IEEE-ACM
15 years 8 months ago
Residual Test Coverage Monitoring
Structural coverage criteria are often used as an indicator of the thoroughness of testing, but complete satisfaction of a criterion is seldom achieved. When a software product is...
Christina Pavlopoulou, Michal Young
COMPSAC
2007
IEEE
15 years 8 months ago
AOP-based automated unit test classification of large benchmarks
Despite the availability of a variety of program analysis tools, evaluation of these tools is difficult, as only few benchmark suites exist. Existing benchmark suites lack the uni...
Cyrille Artho, Zhongwei Chen, Shinichi Honiden
ITC
1991
IEEE
80views Hardware» more  ITC 1991»
15 years 8 months ago
An Intelligent Approach to Automatic Test Equipment
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...
William R. Simpson, John W. Sheppard
INTERSPEECH
2010
14 years 11 months ago
Constructing Japanese test collections for spoken term detection
Spoken Document Retrieval (SDR) and Spoken Term Detection (STD) have been two of the most intensively investigated topics in spoken document processing research according to the e...
Yoshiaki Itoh, Hiromitsu Nishizaki, Xinhui Hu, Hir...