6293 search results - page 432 / 1259 » Information Flow Testing |
208
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DAC
2005
ACM
15 years 9 months ago
2005
ACM
With 90nm CMOS in production and 65nm testing in progress, power has been pushed to the forefront of design metrics. This paper will outline practical techniques that are used to ...
239
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DFT
2005
IEEE
15 years 9 months ago
2005
IEEE
A built-in self-test (BIST) scheme is presented which both reduces overhead for detecting random-pattern-resistant (r.p.r.) faults as well as reduces power consumption during test...
189
Voted
ASPDAC
2008
ACM
15 years 9 months ago
2008
ACM
Power dissipation is quickly becoming one of the most important limiters in nanometer IC design for leakage increases exponentially as the technology scaling down. However, power ...
224
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CONEXT
2008
ACM
15 years 9 months ago
2008
ACM
Recent research on Internet traffic classification algorithms has yielded a flurry of proposed approaches for distinguishing types of traffic, but no systematic comparison of the ...
174
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APVIS
2008
15 years 8 months ago
2008
Motivated by the growing interest in the use of ridges in scientific visualization, we analyze the two height ridge definitions by Eberly and Lindeberg. We propose a raw feature d...