40 search results - page 1 / 8 » Initialization of Sequential Circuits and its Application to... |
ET
1998
13 years 8 months ago
1998
ATS
1997
IEEE
14 years 1 months ago
1997
IEEE
Testing circuits which do not include a global reset signal requires either complex ATPG algorithms based on 9- or even 256-valued algebras, or some suitable method to generate in...
DATE
1999
IEEE
14 years 1 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
TCAD
1998
13 years 8 months ago
1998
—New methods for fault-effect propagation and state justification that use finite-state-machine sequences are proposed for sequential circuit test generation. Distinguishing se...
ISCAS
2007
IEEE
14 years 3 months ago
2007
IEEE
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...