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ITC
2003
IEEE
120views Hardware» more  ITC 2003»
16 years 10 days ago
Test Vector Generation Based on Correlation Model for Ratio-Iddq
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this p...
Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota
UM
2001
Springer
15 years 11 months ago
Modeling Literary Style for Semi-automatic Generation of Poetry
Abstract. The generation of formal poetry involves both complex creativity usually exercised by a human poet - and strict algorithmic restrictions regarding the metrical structure ...
Pablo Gervás
IFIP
1999
Springer
15 years 11 months ago
Design Error Diagnosis in Digital Circuits without Error Model
We describe a new method for design error diagnosis in digital circuits, that doesn’t use any error model. A diagnostic specific pre-analysis of the circuit extracts a subcircui...
Raimund Ubar, Dominique Borrione
FMICS
2007
Springer
15 years 11 months ago
Model Classifications and Automated Verification
Due to the significant progress in automated verification, there are often several techniques for a particular verification problem. In many circumstances different techniques are ...
Radek Pelánek
CONCUR
2006
Springer
15 years 10 months ago
A Complete Axiomatic Semantics for the CSP Stable-Failures Model
Traditionally, the various semantics of the process algebra Csp are formulated in denotational style. For many Csp models, e.g., the traces model, equivalent semantics have been gi...
Yoshinao Isobe, Markus Roggenbach