In this paper, we address the task of crosslingual semantic relatedness. We introduce a method that relies on the information extracted from Wikipedia, by exploiting the interlang...
With the adoption of ultra regular fabric paradigms for controlling design printability at the 22nm node and beyond, there is an emerging need for a layout-driven, pattern-based p...
Tarek A. El-Moselhy, Ibrahim M. Elfadel, Luca Dani...
Double patterning lithography (DPL) is a likely resolution enhancement technique for IC production in 32nm and below technology nodes. However, DPL gives rise to two independent, ...
Abstract Early failure detection in motor pumps is an important issue in prediction maintenance. An efficient condition-monitoring scheme is capable of providing warning and predic...
Flavia Cristina Bernardini, Ana Cristina Bicharra ...
To avoid unnecessary maintenance costs in large IT systems resulting from poorly planned changes, it is essential to manage and control changes to the system and to verify that all...