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CONSTRAINTS
2007
15 years 2 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
139
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ISLPED
1998
ACM
15 years 6 months ago
1998
ACM
This paper presents a model of dynamically variable voltage processor and basic theorems for power-delay optimization. A static voltage scheduling problem is also proposed and for...
140
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CVPR
2008
IEEE
16 years 4 months ago
2008
IEEE
We propose a novel global pose estimation method to detect body parts of articulated objects in images based on non-tree graph models. There are two kinds of edges defined in the ...
97
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EOR
2006
15 years 2 months ago
2006
This paper presents a new data classification method based on mixed-integer programming. Traditional approaches that are based on partitioning the data sets into two groups perfor...
128
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FPGA
1999
ACM
15 years 6 months ago
1999
ACM
Multi-FPGA systems are used as custom computing machines to solve compute intensive problems and also in the verification and prototyping of large circuits. In this paper, we addr...