1598 search results - page 64 / 320 » Integrating Component Tests to System Tests |
TAP
2008
Springer
14 years 9 months ago
2008
Springer
Pex automatically produces a small test suite with high code coverage for a .NET program. To this end, Pex performs a systematic program analysis (using dynamic symbolic execution,...
DATE
2006
IEEE
15 years 3 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
VLSID
2000
IEEE
15 years 2 months ago
2000
IEEE
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
IWANN
2009
Springer
15 years 4 months ago
2009
Springer
In this paper we present the integration of graph-based visual perception to spoken conversation in human-robot interaction. The proposed architecture has a dialogue manager as the...
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SOCO
2009
Springer
15 years 4 months ago
2009
Springer
Model composition helps designers managing complexities by modeling different system views separately, and later compose them into an integrated model. In the past years, researche...