1624 search results - page 34 / 325 » Integrating Fault-Tolerant Techniques into the Design of Cri... |
112
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DAC
2003
ACM
16 years 2 months ago
2003
ACM
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...
114
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GLVLSI
2008
IEEE
15 years 8 months ago
2008
IEEE
Reliability has become a practical concern in today’s VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance wa...
103
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TCAD
2002
15 years 1 months ago
2002
As very large scale integration (VLSI) circuit speed rapidly increases, the inductive effects of interconnect lines strongly impact the signal integrity of a circuit. Since these i...
160
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ISPA
2004
Springer
15 years 7 months ago
2004
Springer
Static DHT topologies influence important features of such DHTs such as scalability, communication load balancing, routing efficiency and fault tolerance. Nevertheless, it is co...
DAC
2006
ACM
16 years 2 months ago
2006
ACM
Simulation and verification using electronic design automation (EDA) tools are key steps in the design process for communication and signal processing systems. The synchronous dat...