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GLVLSI
2002
IEEE
136views VLSI» more  GLVLSI 2002»
15 years 7 months ago
Test generation for resistive opens in CMOS
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
Arun Krishnamachary, Jacob A. Abraham
GLVLSI
2005
IEEE
118views VLSI» more  GLVLSI 2005»
15 years 7 months ago
High-diagnosability online built-in self-test of FPGAs via iterative bootstrapping
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
Vishal Suthar, Shantanu Dutt
ASPLOS
2010
ACM
15 years 8 months ago
Virtualized and flexible ECC for main memory
We present a general scheme for virtualizing main memory errorcorrection mechanisms, which map redundant information needed to correct errors into the memory namespace itself. We ...
Doe Hyun Yoon, Mattan Erez
AOSD
2007
ACM
15 years 6 months ago
Applying aspects to a real-time embedded operating system
The application of aspect-oriented programming (AOP) to the embedded operating system domain is still a very controversial topic, as this area demands high performance and small m...
Francisco Afonso, Carlos A. Silva, Sergio Monteneg...
ISLPED
2005
ACM
136views Hardware» more  ISLPED 2005»
15 years 7 months ago
Energy efficient SEU-tolerance in DVS-enabled real-time systems through information redundancy
Concerns about the reliability of real-time embedded systems that employ dynamic voltage scaling has recently been highlighted [1,2,3], focusing on transient-fault-tolerance techn...
Alireza Ejlali, Marcus T. Schmitz, Bashir M. Al-Ha...