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DAC
2010
ACM
13 years 10 months ago
LUT-based FPGA technology mapping for reliability
As device size shrinks to the nanometer range, FPGAs are increasingly prone to manufacturing defects. We anticipate that the ability to tolerate multiple defects will be very impo...
Jason Cong, Kirill Minkovich
ICDE
2004
IEEE
128views Database» more  ICDE 2004»
14 years 7 months ago
Detection and Correction of Conflicting Source Updates for View Maintenance
Data integration over multiple heterogeneous data sources has become increasingly important for modern applications. The integrated data is usually stored in materialized views fo...
Songting Chen, Jun Chen, Xin Zhang, Elke A. Runden...
VLSID
2006
IEEE
150views VLSI» more  VLSID 2006»
14 years 6 months ago
A Comprehensive SoC Design Methodology for Nanometer Design Challenges
SoC design methodologies are under constant revision due to adoption of fast shrinking process technologies at nanometer levels. Nanometer process geometries exhibit new complex d...
R. Raghavendra Kumar, Ricky Bedi, Ramadas Rajagopa...
BMCBI
2010
119views more  BMCBI 2010»
13 years 6 months ago
Multi-task learning for cross-platform siRNA efficacy prediction: an in-silico study
Background: Gene silencing using exogenous small interfering RNAs (siRNAs) is now a widespread molecular tool for gene functional study and new-drug target identification. The key...
Qi Liu, Qian Xu, Vincent Wenchen Zheng, Hong Xue, ...
DOLAP
2006
ACM
14 years 7 days ago
Towards a logical multidimensional model for spatial data warehousing and OLAP
Decision support systems (DSS) may be enhanced qualitatively if they are able to also deal with spatial dimensions and measures. Regardless the evident importance of using data wa...
Marcus Costa Sampaio, Andre Gomes de Sousa, Cl&aac...