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17 years 4 months ago
Within-die Process Variations: How Accurately can They Be Statistically Modeled?
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
Brendan Hargreaves, Henrik Hult, Sherief Reda
CVPR
2003
IEEE
16 years 7 months ago
Illumination Chromaticity Estimation using Inverse-Intensity Chromaticity Space
Existing color constancy methods cannot handle both uniform colored surfaces and highly textured surfaces in a single integrated framework. Statistics-based methods require many s...
Robby T. Tan, Ko Nishino, Katsushi Ikeuchi
CVPR
2006
IEEE
16 years 7 months ago
Visible Surface Reconstruction from Normals with Discontinuity Consideration
Given a dense set of imperfect normals obtained by photometric stereo or shape from shading, this paper presents an optimization algorithm which alternately optimizes until conver...
Tai-Pang Wu, Chi-Keung Tang
CVPR
2007
IEEE
16 years 7 months ago
Hierarchical Learning of Curves Application to Guidewire Localization in Fluoroscopy
In this paper we present a method for learning a curve model for detection and segmentation by closely integrating a hierarchical curve representation using generative and discrim...
Adrian Barbu, Vassilis Athitsos, Bogdan Georgescu,...
ICIP
1998
IEEE
16 years 6 months ago
Multi-Image Matching for a General Motion Stereo Camera Model
Motion stereo is to extract the 3-0 information of an object from images of a moving camera, using geometric relationships between corresponding points. This paper presents an acc...
Ja Seong Ku, Kyoung Mu Lee, Sang Uk Lee