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99
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ISQED
2008
IEEE
103views Hardware» more  ISQED 2008»
15 years 7 months ago
Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
Bin Zhang, Michael Orshansky
89
Voted
IMSCCS
2007
IEEE
15 years 7 months ago
Ensemble Subsurface Modeling Using Grid Computing Technology
Ensemble Kalman Filter (EnKF) uses a randomized ensemble of subsurface models for error and uncertainty estimation. However, the complexity of geological models and the requiremen...
Xin Li, Zhou Lei, Christopher D. White, Gabrielle ...
84
Voted
ICIP
2005
IEEE
15 years 6 months ago
An active volumetric model for 3D reconstruction
—In this paper, we present an active volumetric model (AVM) for 3D reconstruction from multiple calibrated images of a scene. The AVM is a physically motivated 3D deformable mode...
Xin Liu, Hongxun Yao, Xilin Chen, Wen Gao
104
Voted
EMSOFT
2006
Springer
15 years 4 months ago
A timing model for synchronous language implementations in simulink
We describe a simple scheme for mapping synchronous language models, in the form of Boolean Mealy Machines, into timed automata. The mapping captures certain idealized implementat...
Timothy Bourke, Arcot Sowmya
97
Voted
SCSC
2007
15 years 2 months ago
Damage mechanics modeling of concurrent thermal and vibration loading on electronics packaging
— The problem of concurrent thermal and vibration loading has not been thoroughly studied even though it is common in electronic packaging applications. Here we attempt to addres...
Cemal Basaran, Juan Gomez, Minghui Lin, Shidong Li