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WSC
2007
15 years 7 months ago
Sensitivity analysis on causal events of WIP bubbles by a log-driven simulator
Fluctuations of work-in-progress (WIP) levels cause variability of cycle time and often lead to productivity losses in semiconductor wafer fabrication plants. To identify sources ...
Ryo Hirade, Rudy Raymond, Hiroyuki Okano
WSC
2001
15 years 6 months ago
Emulation: debug it in the lab --- not on the floor
Emulation is a very powerful tool for testing and debugging control code/logic in an office environment rather than on the plant floor. Through the use of emulation, the actual co...
Cindy Schiess
122
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WSC
2001
15 years 6 months ago
Simulation data exchange (SDX) implementation and use
Facility layouts of existing or proposed production systems often form the basis of a dynamic simulation study to prove the design concept and to determine if the required through...
David P. Sly, Shreekanth Moorthy
133
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AUTOMATICA
2006
94views more  AUTOMATICA 2006»
15 years 5 months ago
Subspace identification for FDI in systems with non-uniformly sampled multirate data
This paper proposes a novel subspace approach towards direct identification of a residual model for fault detection and isolation (FDI) in a system with non-uniformly sampled mult...
Weihua Li, Zhengang Han, Sirish L. Shah
WSC
2008
15 years 7 months ago
Experience in the broadening of a single-purpose simulation model
Simulation models are often developed for a single purpose. However, once a model is accepted by management and other stake-holders, it is quite common and desirable to wish to br...
Reid L. Kress, Pete Bereolos, Karen Bills, James C...