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ITC
2003
IEEE
139views Hardware» more  ITC 2003»
15 years 9 months ago
Fault Pattern Oriented Defect Diagnosis for Memories
Failure analysis (FA) and diagnosis of memory cores plays a key role in system-on-chip (SOC) product development and yield ramp-up. Conventional FA based on bitmaps and the experi...
Chih-Wea Wang, Kuo-Liang Cheng, Jih-Nung Lee, Yung...
LICS
2003
IEEE
15 years 9 months ago
Labelled Markov Processes: Stronger and Faster Approximations
This paper reports on and discusses three notions of approximation for Labelled Markov Processes that have been developed last year. The three schemes are improvements over former...
Vincent Danos, Josee Desharnais
VISUALIZATION
2003
IEEE
15 years 9 months ago
Visualizing Spatial and Temporal Variability in Coastal Observatories
In this paper, we describe a set of 3D and 4D visualization tools and techniques for CORIE, a complex environmental observation and forecasting system (EOFS) for the Columbia Rive...
Walter Jiménez, Wagner Toledo Corrêa,...
WORDS
2003
IEEE
15 years 9 months ago
Towards the Delay and Synchronization Control for Networked Real-Time Multi-Object Multimedia Applications
Due to the lack of QoS support, ensuring an acceptable application level QoS for the real-time delivery of multiobject multimedia presentations on the current Internet is very cha...
Haining Liu, Magda El Zarki
IMC
2003
ACM
15 years 9 months ago
Variability in TCP round-trip times
We measured and analyzed the variability in round trip times (RTTs) within TCP connections using passive measurement techniques. We collected eight hours of bidirectional traces c...
Jay Aikat, Jasleen Kaur, F. Donelson Smith, Kevin ...
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