12131 search results - page 2281 / 2427 » Introduction to Modeling and Simulation |
130
Voted
ICCAD
2007
IEEE
16 years 12 days ago
2007
IEEE
— Starting at the 65nm node, stress engineering to improve performance of transistors has been a major industry focus. An intrinsic stress source – shallow trench isolation –...
122
Voted
ICCAD
2003
IEEE
16 years 12 days ago
2003
IEEE
Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for ne...
159
Voted
ICCAD
2003
IEEE
16 years 12 days ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
137
Voted
IUI
2010
ACM
16 years 12 days ago
2010
ACM
Most of the previous work on non-invasive brain-computer interfaces (BCIs) has been focused on feature extraction and classification algorithms to achieve high performance for the...
155
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EVOW
2010
Springer
15 years 10 months ago
2010
Springer
DEODHAR, SUSHAMNA DEODHAR. Using Grammatical Evolution Decision Trees for Detecting Gene-Gene Interactions in Genetic Epidemiology. (Under the direction of Dr. Alison Motsinger-Re...