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» Introduction to Pattern Recognition
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IBPRIA
2009
Springer
15 years 11 months ago
Texture Measuring by Means of Perceptually-Based Fineness Functions
Jesús Chamorro-Martínez, Pedro Mart&...
128
Voted
IBPRIA
2009
Springer
15 years 11 months ago
Index of Balanced Accuracy: A Performance Measure for Skewed Class Distributions
Vicente García, Ramón Alberto Mollin...
MCS
2001
Springer
15 years 10 months ago
Automatic Classification of Clustered Microcalcifications by a Multiple Classifier System
Pasquale Foggia, Carlo Sansone, Francesco Tortorel...
134
Voted
SSPR
1998
Springer
15 years 10 months ago
Non-linear Mapping for Feature Extraction
Paul Scheunders, Steve De Backer, Antoine Naud
IBPRIA
2007
Springer
15 years 10 months ago
Structure Restriction for Tracking Through Multiple Views and Occlusions
Brais Martínez, A. Pérez, Luis Ferra...