5153 search results - page 696 / 1031 » Introduction to Randomized Algorithms |
109
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EVOW
2008
Springer
15 years 6 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
141
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ACL
2008
15 years 6 months ago
2008
We present a novel framework for the discovery and representation of general semantic relationships that hold between lexical items. We propose that each such relationship can be ...
132
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IJCAI
2007
15 years 6 months ago
2007
Abstract. In this paper, nogood recording is investigated for CSP within the randomization and restart framework. Our goal is to avoid the same situations to occur from one run to ...
143
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NIPS
2008
15 years 6 months ago
2008
We show that an important and computationally challenging solution space feature of the graph coloring problem (COL), namely the number of clusters of solutions, can be accurately...
147
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AAAI
2006
15 years 5 months ago
2006
We propose two new online methods for estimating the size of a backtracking search tree. The first method is based on a weighted sample of the branches visited by chronological ba...