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115
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ICCAD
2008
IEEE
16 years 1 days ago
2008
IEEE
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...
115
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ICCAD
2003
IEEE
16 years 1 days ago
2003
IEEE
As current silicon-based techniques fast approach their practical limits, the investigation of nanoscale electronics, devices and system architectures becomes a central research p...
112
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CVPR
2010
IEEE
15 years 11 months ago
2010
IEEE
Active learning methods aim to select the most informative unlabeled instances to label first, and can help to focus image or video annotations on the examples that will most impr...
159
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CVPR
2010
IEEE
15 years 11 months ago
2010
IEEE
Detecting objects in cluttered scenes and estimating articulated human body parts are two challenging problems in computer vision. The difficulty is particularly pronounced in ac...
122
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WWW
2010
ACM
15 years 10 months ago
2010
ACM
We consider the problem of deep web source selection and argue that existing source selection methods are inadequate as they are based on local similarity assessment. Specificall...