91 search results - page 6 / 19 » Investigating the impact of design processes on children |
85
Voted
ISQED
2007
IEEE
15 years 6 months ago
2007
IEEE
Process related variations are considered a major concern in emerging sub-65nm technologies. In this paper, we investigate the impact of process variations on different types of c...
SOCC
2008
IEEE
15 years 6 months ago
2008
IEEE
— Several design metrics have been used in the past to evaluate the SRAM cell stability. However, most of them fail to provide the exact stability figures as shown in this paper...
92
Voted
DATE
2010
IEEE
15 years 5 months ago
2010
IEEE
— In this paper, we examine the impact of application task mapping on the reliability of MPSoC in the presence of single-event upsets (SEUs). We propose a novel soft erroraware d...
92
Voted
ISQED
2010
IEEE
15 years 7 months ago
2010
IEEE
With the CMOS transistors being scaled to sub 45nm and lower, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging pr...
TVCG
2010
14 years 10 months ago
2010
—We present TanGeoMS, a tangible geospatial modeling visualization system that couples a laser scanner, projector, and a flexible physical three-dimensional model with a standar...