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ICIP
2010
IEEE
15 years 2 months ago
Stochastic gradient descent for robust inverse photomask synthesis in optical lithography
Optical lithography is a critical step in the semiconductor manufacturing process, and one key problem is the design of the photomask for a particular circuit pattern, given the o...
Ningning Jia, Edmund Y. Lam
ICPR
2010
IEEE
15 years 2 months ago
3D Human Body Modeling Using Range Data
For the 3D modeling of walking humans the determination of body pose and extraction of body parts, from the sensed 3D range data, are challenging image processing problems. Real b...
Koichiro Yamauchi, Bir Bhanu, Hideo Saito
ICST
2010
IEEE
15 years 2 months ago
Automated Test Data Generation on the Analyses of Feature Models: A Metamorphic Testing Approach
A Feature Model (FM) is a compact representation of all the products of a software product line. The automated extraction of information from FMs is a thriving research topic invo...
Sergio Segura, Robert M. Hierons, David Benavides,...
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ICTAI
2010
IEEE
15 years 2 months ago
A Closer Look at MOMDPs
Abstract--The difficulties encountered in sequential decisionmaking problems under uncertainty are often linked to the large size of the state space. Exploiting the structure of th...
Mauricio Araya-López, Vincent Thomas, Olivi...
NAACL
2010
15 years 2 months ago
From Baby Steps to Leapfrog: How "Less is More" in Unsupervised Dependency Parsing
We present three approaches for unsupervised grammar induction that are sensitive to data complexity and apply them to Klein and Manning's Dependency Model with Valence. The ...
Valentin I. Spitkovsky, Hiyan Alshawi, Daniel Jura...
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