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ITC
1991
IEEE
80views Hardware» more  ITC 1991»
15 years 7 months ago
An Intelligent Approach to Automatic Test Equipment
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...
William R. Simpson, John W. Sheppard
131
Voted
ASAP
2008
IEEE
120views Hardware» more  ASAP 2008»
15 years 5 months ago
Lightweight DMA management mechanisms for multiprocessors on FPGA
This paper presents a multiprocessor system on FPGA that adopts Direct Memory Access (DMA) mechanisms to move data between the external memory and the local memory of each process...
Antonino Tumeo, Matteo Monchiero, Gianluca Palermo...
ASPDAC
2008
ACM
103views Hardware» more  ASPDAC 2008»
15 years 5 months ago
Reliability-aware design for nanometer-scale devices
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is increasing processor power densities and temperatures; thus, creating challenges...
David Atienza, Giovanni De Micheli, Luca Benini, J...
CASES
2008
ACM
15 years 5 months ago
Control flow optimization in loops using interval analysis
We present a novel loop transformation technique, particularly well suited for optimizing embedded compilers, where an increase in compilation time is acceptable in exchange for s...
Mohammad Ali Ghodrat, Tony Givargis, Alex Nicolau
ADBIS
2006
Springer
160views Database» more  ADBIS 2006»
15 years 5 months ago
Data Ring: Let Us Turn the Net into a Database!
Because of information ubiquity, one observes an important trend towards transferring information management tasks from database systems to networks. We introduce the notion of Da...
Serge Abiteboul, Neoklis Polyzotis
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