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DCC
2005
IEEE
15 years 9 months ago
2005
IEEE
Elliptic curve cryptosystems in the presence of faults were studied by Biehl, Meyer and M?uller (2000). The first fault model they consider requires that the input point P in the c...
DCC
2001
IEEE
15 years 9 months ago
2001
IEEE
A method for demonstrating and enumerating uniformly efficient (permutation-optimal) trellis decoders for self-dual codes of high minimum distance is developed. Such decoders and c...
ICCAD
2007
IEEE
15 years 7 months ago
2007
IEEE
—As the 193nm lithography is likely to be used for 45nm and even 32nm processes, much more stringent requirement will be posed on Optical Proximity Correction (OPC) technologies....
ICCAD
2006
IEEE
15 years 7 months ago
2006
IEEE
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributio...
IUI
2009
ACM
15 years 7 months ago
2009
ACM
Concept maps are an important tool to knowledge organization, representation, and sharing. Most current concept map tools do not provide full support for hand-drawn concept map cr...