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VTS
1995
IEEE
94views Hardware» more  VTS 1995»
13 years 9 months ago
Synthesis of locally exhaustive test pattern generators
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
Günter Kemnitz
ISSRE
2006
IEEE
14 years 8 days ago
Metamodel-based Test Generation for Model Transformations: an Algorithm and a Tool
In a Model-Driven Development context (MDE), model transformations allow memorizing and reusing design know-how, and thus automate parts of the design and refinement steps of a so...
Erwan Brottier, Franck Fleurey, Jim Steel, Benoit ...
PASTE
2005
ACM
13 years 11 months ago
Generalizing symbolic execution to library classes
Forward symbolic execution is a program analysis technique that allows using symbolic inputs to explore program executions. The traditional applications of this technique have foc...
Sarfraz Khurshid, Yuk Lai Suen
FASE
2009
Springer
14 years 1 months ago
Reducing the Costs of Bounded-Exhaustive Testing
Abstract. Bounded-exhaustive testing is an automated testing methodology that checks the code under test for all inputs within given bounds: first the user describes a set of test...
Vilas Jagannath, Yun Young Lee, Brett Daniel, Dark...
ET
2000
145views more  ET 2000»
13 years 6 months ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar