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DAC
1998
ACM
15 years 10 months ago
Layout Techniques for Minimizing On-Chip Interconnect Self Inductance
Because magnetic e ects have a much longer spatial range than electrostatic e ects, an interconnect line with large inductance will be sensitive to distant variations in interconn...
Yehia Massoud, Steve S. Majors, Tareq Bustami, Jac...
VLSID
2000
IEEE
102views VLSI» more  VLSID 2000»
15 years 1 months ago
Inductance Characterization of Small Interconnects Using Test-Signal Method
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
Jeegar Tilak Shah, Madhav P. Desai, Sugata Sanyal