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DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
15 years 9 months ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...
ICML
1994
IEEE
15 years 6 months ago
Towards a Better Understanding of Memory-based Reasoning Systems
John Rachlin, Simon Kasif, Steven Salzberg, David ...
IJCAI
2003
15 years 4 months ago
Inductive Learning in Less Than One Sequential Data Scan
Most recent research of scalable inductive learning on very large dataset, decision tree construction in particular, focuses on eliminating memory constraints and reducing the num...
Wei Fan, Haixun Wang, Philip S. Yu, Shaw-hwa Lo
DATE
2007
IEEE
126views Hardware» more  DATE 2007»
15 years 9 months ago
Dynamic learning based scan chain diagnosis
Scan chain defect diagnosis is important to silicon debug and yield enhancement. Traditional simulationbased chain diagnosis algorithms may take long run time if a large number of...
Yu Huang
CVPR
2005
IEEE
16 years 5 months ago
Discriminative Learning of Markov Random Fields for Segmentation of 3D Scan Data
We address the problem of segmenting 3D scan data into objects or object classes. Our segmentation framework is based on a subclass of Markov Random Fields (MRFs) which support ef...
Dragomir Anguelov, Benjamin Taskar, Vassil Chatalb...