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CVPR
2008
IEEE
16 years 18 days ago
Local minima free Parameterized Appearance Models
Parameterized Appearance Models (PAMs) (e.g. Eigentracking, Active Appearance Models, Morphable Models) are commonly used to model the appearance and shape variation of objects in...
Minh Hoai Nguyen, Fernando De la Torre
ICML
2006
IEEE
15 years 11 months ago
Discriminative cluster analysis
Clustering is one of the most widely used statistical tools for data analysis. Among all existing clustering techniques, k-means is a very popular method because of its ease of pr...
Fernando De la Torre, Takeo Kanade
ICML
2002
IEEE
15 years 11 months ago
Exact model averaging with naive Bayesian classifiers
The naive classifier is a well-established mathematical model whose simplicity, speed and accuracy have made it a popular choice for classification in AI and engineering. In this ...
Denver Dash, Gregory F. Cooper
ICML
2000
IEEE
15 years 11 months ago
Maximum Entropy Markov Models for Information Extraction and Segmentation
Hidden Markov models (HMMs) are a powerful probabilistic tool for modeling sequential data, and have been applied with success to many text-related tasks, such as part-of-speech t...
Andrew McCallum, Dayne Freitag, Fernando C. N. Per...
ICML
1997
IEEE
15 years 11 months ago
Characterizing the generalization performance of model selection strategies
Abstract: We investigate the structure of model selection problems via the bias/variance decomposition. In particular, we characterize the essential structure of a model selection ...
Dale Schuurmans, Lyle H. Ungar, Dean P. Foster