23703 search results - page 4489 / 4741 » Learning from Demonstration |
134
Voted
ICCAD
2006
IEEE
16 years 17 days ago
2006
IEEE
In order to handle device matching in analog circuits, some pairs of modules are required to be placed symmetrically. This paper addresses this device-level placement problem for ...
122
Voted
ICCAD
2005
IEEE
16 years 17 days ago
2005
IEEE
: Double-Gate (DG) transistors have emerged as promising devices for nano-scale circuits due to their better scalability compared to bulk CMOS. Among the various types of DG device...
159
Voted
ICCAD
2003
IEEE
16 years 17 days ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
142
Voted
ICCAD
2003
IEEE
16 years 17 days ago
2003
IEEE
Symbolic image computation is the most fundamental computation in BDD-based sequential system optimization and formal verification. In this paper, we explore the use of over-appr...
127
Voted
ICCAD
2001
IEEE
16 years 17 days ago
2001
IEEE
Timing closure problems occur when timing estimates computed during logic synthesis do not match with timing estimates computed from the layout of the circuit. In such a situation...